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 TC74HC597AP/AF
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74HC597AP,TC74HC597AF
8-Bit Latch/Shift Register
The TC74HC597A is a high speed CMOS 8-BIT PARALLEL-IN/SERIAL-IN SERIAL-OUT LATCH/SHIFT REGISTER fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. It consists of an 8-bit data register feeding an 8-bit shift register. The parallel data on the A to H inputs is stored in the input register on the positive going transition of RCK. When the SLOAD input is held low, the input register data is passed into the shift registers. When SLOAD input is held high, the serial data input (SI) is enabled and the eight flip-flops perform serial shifting on the positive transition of SCK. A direct clear input ( SCLR ) sets the 8-bit shift register to zero. All inputs are equipped with protection circuits against static discharge or transient excess voltage.
TC74HC597AP
TC74HC597AF
Features
* * * * * * * * High speed: fmax = 60 MHz (typ.) at VCC = 5 V Low power dissipation: ICC = 4 A (max) at Ta = 25C High noise immunity: VNIH = VNIL = 28% VCC Output drive capability: 10 LSTTL loads Symmetrical output impedance: |IOH| = IOL = 4 mA (min) Balanced propagation delays: tpLH - tpHL Wide operating voltage range: VCC (opr) = 2 to 6 V Pin and function compatible with 74LS597 Weight DIP16-P-300-2.54A SOP16-P-300-1.27A : 1.00 g (typ.) : 0.18 g (typ.)
Pin Assignment
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TC74HC597AP/AF
IEC Logic Symbol
Truth Table
Inputs SI X X L H X X X X X SCK X X
SCLR
L H H H H X X
SLOAD
H L H H H X X
RCK X X X X X S.R. is cleared to "L"
Function
Input register data is stored into S.R. First stage of S.R. become "L". Other stages store the data of previous stage, respectively. First stage of S.R. become "H". Other stages store the data of previous stage, respectively. State of S.R. is not changed. Input data on A to H line is stored into input register. Storage register stage is not changed.
X: Don't care
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Timing Chart
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System Diagram
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Absolute Maximum Ratings (Note 1)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating -0.5 to 7.0 -0.5 to VCC + 0.5 -0.5 to VCC + 0.5 20 20 25 50 500 (DIP) (Note 2)/180 (SOP) -65 to 150 Unit V V V mA mA mA mA mW C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = -40 to 65C. From Ta = 65 to 85C a derating factor of -10 mW/C should be applied until 300 mW.
Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VCC VIN VOUT Topr Rating 2 to 6 0 to VCC 0 to VCC -40 to 85 0 to 1000 (VCC = 2.0 V) Input rise and fall time tr, tf 0 to 500 (VCC = 4.5 V) 0 to 400 (VCC = 6.0 V) ns Unit V V V C
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
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Electrical Characteristics
DC Characteristics
Test Condition Characteristics Symbol VCC (V) 2.0 High-level input voltage VIH 4.5 6.0 2.0 Low-level input voltage VIL 4.5 6.0 2.0 High-level output voltage VIN = VIH or VIL IOH = -20 A IOH = -4 mA IOH = -5.2 mA IOL = 20 A IOL = 4 mA IOL = 5.2 mA Input leakage current Quiescent supply current IIN ICC VIN = VCC or GND VIN = VCC or GND 4.5 6.0 4.5 6.0 2.0 Low-level output voltage VIN = VIH or VIL 4.5 6.0 4.5 6.0 6.0 6.0 Min 1.50 3.15 4.20 1.9 4.4 5.9 4.18 5.68 Ta = 25C Typ. 2.0 4.5 6.0 4.31 5.80 0.0 0.0 0.0 0.17 0.18 Max 0.50 1.35 1.80 0.1 0.1 0.1 0.26 0.26 0.1 4.0 Ta = -40 to 85C Min 1.50 3.15 4.20 1.9 4.4 5.9 4.13 5.63 Max 0.50 1.35 1.80 0.1 0.1 0.1 0.33 0.33 1.0 40.0 A A V V V V Unit
VOH
VOL
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Timing Requirements (input: tr = tf = 6 ns)
Characteristics Symbol Test Condition VCC (V) Minimum pulse width (SCK, RCK) tW (H) tW (L) 2.0 4.5 6.0 Ta = 25C Typ. Limit 75 15 13 Ta = -40 to 85C Limit 95 19 16 ns Unit
Minimum pulse width ( SCLR )
2.0 tW (L)
75 15 13 75 15 13 100 20 17 75 15 13 75 15 13 0 0 0 75 15 13 6 30 35
95 19 16 95 19 16 125 25 21 95 19 16 95 19 16 0 0 0 95 19 16 5 24 28 MHz ns ns ns ns ns ns ns
4.5 6.0 2.0
Minimum pulse width ( SLOAD )
tW (L)
4.5 6.0 2.0
Minimum set-up time (RCK- SLOAD )
ts
4.5 6.0 2.0
Minimum set-up time (SI-SCK)
ts
4.5 6.0 2.0
Minimum set-up time (PI-RCK)
ts
4.5 6.0 2.0
Minimum hold time
th
4.5 6.0
Minimum removal time ( SCLR , SLOAD )
2.0 trem
4.5 6.0 2.0
Clock frequency
f
4.5 6.0
AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25C, input: tr = tf = 6 ns)
Characteristics Output transition time Propagation delay time (SCK-QH') Propagation delay time ( SCLR -QH') Propagation delay time ( SLOAD -QH') Propagation delay time (RCK-QH') Clock frequency Symbol tTLH tTHL tpLH tpHL tpHL tpLH tpHL tpLH tpHL fmax SLOAD = "L"
Test Condition
Min
Typ. 5
Max 8
Unit ns
16
25
ns
20
32
ns
18
30
ns
25 59
37
ns MHz
30
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AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns)
Test Condition Characteristics Symbol VCC (V) 2.0
Ta = 25C Min

Ta = -40 to 85C Max 75 15 13 145 29 25 175 35 30 175 35 30 210 42 36

Unit
Typ. 32 8 7 78 20 16 90 24 20 80 22 18 112 30 24 12 48 50 5 60
Min

Max 95 19 16 180 36 31 220 44 37 220 44 37 265 53 45

Output transition time
tTLH tTHL
4.5 6.0 2.0
ns
Propagation delay time (SCK-QH') Propagation delay time ( SCLR -QH') Propagation delay time ( SLOAD -QH') Propagation delay time (RCK-QH')
tpLH tpHL
4.5 6.0 2.0
ns
tpHL
4.5 6.0
ns
tpLH tpHL
2.0
4.5 6.0 2.0
ns
tpLH tpHL
SLOAD = "L"
4.5 6.0 2.0
ns
6 30 35

5 24 28

Maximum clock frequency Input capacitance Power dissipation capacitance
fmax
4.5 6.0
MHz
CIN CPD (Note)

10
10
pF pF
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPDVCCfIN + ICC
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Package Dimensions
Weight: 1.00 g (typ.)
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Package Dimensions
Weight: 0.18 g (typ.)
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TC74HC597AP/AF
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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